sensitive hybrid pixel electron detector dectris ela Search Results


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Dectris AG ela hybrid pixel electron detector
Ela Hybrid Pixel Electron Detector, supplied by Dectris AG, used in various techniques. Bioz Stars score: 96/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Dectris AG pixelated direct electron detector
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Dectris AG pixelated 4d stem detector
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TVIPS GmbH universal scan generator (usg
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Dectris AG pixel dedicated 100 kev detector
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Hitachi Ltd kv scanning electron microscope
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CEOS GmbH electron energy filter cefid
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TESCAN USA Inc tescan tensor
Representative reference images used to select interesting BaSO 4 crystallites. The red crosses correspond to the positions where the beam was placed to acquire ED patterns. ( a ) STEM-HAADF image from the JEOL F200 TEM at 200 kV. ( b ) STEM-BF image from the <t>TESCAN</t> <t>Tensor</t> <t>microscope</t> at 100 kV.
Tescan Tensor, supplied by TESCAN USA Inc, used in various techniques. Bioz Stars score: 97/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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JEOL jem2100plus tem
Representative reference images used to select interesting BaSO 4 crystallites. The red crosses correspond to the positions where the beam was placed to acquire ED patterns. ( a ) STEM-HAADF image from the JEOL F200 TEM at 200 kV. ( b ) STEM-BF image from the <t>TESCAN</t> <t>Tensor</t> <t>microscope</t> at 100 kV.
Jem2100plus Tem, supplied by JEOL, used in various techniques. Bioz Stars score: 98/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Rigaku Corporation micromax 007 hf rotating anode
Representative reference images used to select interesting BaSO 4 crystallites. The red crosses correspond to the positions where the beam was placed to acquire ED patterns. ( a ) STEM-HAADF image from the JEOL F200 TEM at 200 kV. ( b ) STEM-BF image from the <t>TESCAN</t> <t>Tensor</t> <t>microscope</t> at 100 kV.
Micromax 007 Hf Rotating Anode, supplied by Rigaku Corporation, used in various techniques. Bioz Stars score: 97/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Rigaku Corporation anode rigaku fr x diffractometer
Representative reference images used to select interesting BaSO 4 crystallites. The red crosses correspond to the positions where the beam was placed to acquire ED patterns. ( a ) STEM-HAADF image from the JEOL F200 TEM at 200 kV. ( b ) STEM-BF image from the <t>TESCAN</t> <t>Tensor</t> <t>microscope</t> at 100 kV.
Anode Rigaku Fr X Diffractometer, supplied by Rigaku Corporation, used in various techniques. Bioz Stars score: 96/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Anton Paar anton paar saxspoint 2.0 system
Representative reference images used to select interesting BaSO 4 crystallites. The red crosses correspond to the positions where the beam was placed to acquire ED patterns. ( a ) STEM-HAADF image from the JEOL F200 TEM at 200 kV. ( b ) STEM-BF image from the <t>TESCAN</t> <t>Tensor</t> <t>microscope</t> at 100 kV.
Anton Paar Saxspoint 2.0 System, supplied by Anton Paar, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/sensitive+hybrid+pixel+electron+detector+dectris+ela/anton+paar+saxspoint+2+0+system/10__2139_slash_ssrn__4130248-55-30-33
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Image Search Results


Representative reference images used to select interesting BaSO 4 crystallites. The red crosses correspond to the positions where the beam was placed to acquire ED patterns. ( a ) STEM-HAADF image from the JEOL F200 TEM at 200 kV. ( b ) STEM-BF image from the TESCAN Tensor microscope at 100 kV.

Journal: Journal of Applied Crystallography

Article Title: On the use of beam precession for serial electron crystallography

doi: 10.1107/S1600576725005606

Figure Lengend Snippet: Representative reference images used to select interesting BaSO 4 crystallites. The red crosses correspond to the positions where the beam was placed to acquire ED patterns. ( a ) STEM-HAADF image from the JEOL F200 TEM at 200 kV. ( b ) STEM-BF image from the TESCAN Tensor microscope at 100 kV.

Article Snippet: The second microscope used in this work was a TESCAN Tensor, a STEM-dedicated Schottky FEG operated at 100 kV (0.03701 Å) with a Dectris Quadro detector (16-bit hybrid-pixel direct electron detector of 512 × 512 pixels, 75 μm physical pixel size).

Techniques: Microscopy