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Image Search Results
Journal: Journal of Applied Crystallography
Article Title: On the use of beam precession for serial electron crystallography
doi: 10.1107/S1600576725005606
Figure Lengend Snippet: Representative reference images used to select interesting BaSO 4 crystallites. The red crosses correspond to the positions where the beam was placed to acquire ED patterns. ( a ) STEM-HAADF image from the JEOL F200 TEM at 200 kV. ( b ) STEM-BF image from the TESCAN Tensor microscope at 100 kV.
Article Snippet: The second microscope used in this work was a
Techniques: Microscopy